Quote:
Originally Posted by buzzmaster
some nice ideas and discussions but some need to lighten up a bit and realize they are talking in absolutes about things when they should be saying this is what THEY THINK is going on...
~~~
unless anyone of the ones talking in absolutes have at least popped a wafer and studied the logic structure at a silicon level and have seen and identified these mechanism's there arguing over speculatory thoughts of what they think is going on based on their own reasons...
~~~
sofar the best part of the post has probably gone pretty much unnoticed except for the person that made the comment about the interface being used to test is able to test on all lines... that in itself is probably the most important thing said sofar
~~~
the key is that without a unit able to test on all the lines not much of any of this type of testing can even be attempted, so from my point sofar the best part about the post is being shadowed by the rest of the post...
|
I edited out some stuff, and highlighted some stuff but ONLY to emphasize some of your points , I think your comments show both TECHNICAL understanding, and a GREAT DEAL of INSIGHT into human nature as well ! THANKYOU for a GREAT POST !!!
-------------------------------------
In my opinion , BEFORE you can have a discussion of what is happening INSIDE a device under test , ( a " black box scenario " ) , you must FIRST;
A) DEFINE the baseline operateing conditions
B) DEFINE the DUT measurement methodology
C) DEFINE the proposed test methodology.
all of the above discussions seem to have skipped strait to " C) " without really hitting on A or B .